Fig. 2

Scanning electron microscopy analysis of mature grains and grain cross-sections of OsPHYB mutants and NIP. A Scanning electron photographs of the outer glume of mature seeds in NIP and the osphyb mutant. Bars = 1 mm. B Scanning electron microscopy observation of lemma. Bars = 250 μm. C Magnified view of the outer surface area boxed in (B). Bars = 100 μm. D–E Cell number and cell length of fully mature seeds along the longitudinal axis. *P < 0.05, ** P < 0.01. F Comparison of grain cross sections in osphyb and NIP. Bar = 1 mm. G–I Scanning electron microscopy analysis of different parts of grain cross sections in osphyb and NIP. Bars = 20 μm